Lines Matching refs:APIntTest
20 TEST(APIntTest, ShiftLeftByZero) { in TEST() argument
27 TEST(APIntTest, i128_NegativeCount) { in TEST() argument
45 TEST(APIntTest, i33_Count) { in TEST() argument
58 TEST(APIntTest, i65_Count) { in TEST() argument
68 TEST(APIntTest, i128_PositiveCount) { in TEST() argument
107 TEST(APIntTest, i1) { in TEST() argument
170 TEST(APIntTest, fromString) { in TEST() argument
256 TEST(APIntTest, FromArray) { in TEST() argument
260 TEST(APIntTest, StringBitsNeeded2) { in TEST() argument
280 TEST(APIntTest, StringBitsNeeded8) { in TEST() argument
300 TEST(APIntTest, StringBitsNeeded10) { in TEST() argument
321 TEST(APIntTest, StringBitsNeeded16) { in TEST() argument
341 TEST(APIntTest, toString) { in TEST() argument
396 TEST(APIntTest, Log2) { in TEST() argument
408 TEST(APIntTest, magic) { in TEST() argument
417 TEST(APIntTest, magicu) { in TEST() argument
430 TEST(APIntTest, StringDeath) { in TEST() argument
444 TEST(APIntTest, mul_clear) { in TEST() argument