30 using ValidateBitwise = spvtest::ValidateBase<bool>;  typedef
145 TEST_F(ValidateBitwise, ShiftAllSuccess) {  in TEST_F()  argument
156 TEST_F(ValidateBitwise, OpShiftRightLogicalWrongResultType) {  in TEST_F()  argument
168 TEST_F(ValidateBitwise, OpShiftRightLogicalBaseNotInt) {  in TEST_F()  argument
180 TEST_F(ValidateBitwise, OpShiftRightLogicalBaseWrongDimension) {  in TEST_F()  argument
193 TEST_F(ValidateBitwise, OpShiftRightLogicalBaseWrongBitWidth) {  in TEST_F()  argument
206 TEST_F(ValidateBitwise, OpShiftRightLogicalShiftNotInt) {  in TEST_F()  argument
219 TEST_F(ValidateBitwise, OpShiftRightLogicalShiftWrongDimension) {  in TEST_F()  argument
232 TEST_F(ValidateBitwise, LogicAllSuccess) {  in TEST_F()  argument
244 TEST_F(ValidateBitwise, OpBitwiseAndWrongResultType) {  in TEST_F()  argument
257 TEST_F(ValidateBitwise, OpBitwiseAndLeftNotInt) {  in TEST_F()  argument
269 TEST_F(ValidateBitwise, OpBitwiseAndRightNotInt) {  in TEST_F()  argument
281 TEST_F(ValidateBitwise, OpBitwiseAndLeftWrongDimension) {  in TEST_F()  argument
294 TEST_F(ValidateBitwise, OpBitwiseAndRightWrongDimension) {  in TEST_F()  argument
307 TEST_F(ValidateBitwise, OpBitwiseAndLeftWrongBitWidth) {  in TEST_F()  argument
320 TEST_F(ValidateBitwise, OpBitwiseAndRightWrongBitWidth) {  in TEST_F()  argument
333 TEST_F(ValidateBitwise, OpBitFieldInsertSuccess) {  in TEST_F()  argument
343 TEST_F(ValidateBitwise, OpBitFieldInsertWrongResultType) {  in TEST_F()  argument
356 TEST_F(ValidateBitwise, OpBitFieldInsertWrongBaseType) {  in TEST_F()  argument
369 TEST_F(ValidateBitwise, OpBitFieldInsertWrongInsertType) {  in TEST_F()  argument
382 TEST_F(ValidateBitwise, OpBitFieldInsertOffsetNotInt) {  in TEST_F()  argument
394 TEST_F(ValidateBitwise, OpBitFieldInsertCountNotInt) {  in TEST_F()  argument
406 TEST_F(ValidateBitwise, OpBitFieldSExtractSuccess) {  in TEST_F()  argument
416 TEST_F(ValidateBitwise, OpBitFieldSExtractWrongResultType) {  in TEST_F()  argument
428 TEST_F(ValidateBitwise, OpBitFieldSExtractWrongBaseType) {  in TEST_F()  argument
441 TEST_F(ValidateBitwise, OpBitFieldSExtractOffsetNotInt) {  in TEST_F()  argument
453 TEST_F(ValidateBitwise, OpBitFieldSExtractCountNotInt) {  in TEST_F()  argument
465 TEST_F(ValidateBitwise, OpBitReverseSuccess) {  in TEST_F()  argument
475 TEST_F(ValidateBitwise, OpBitReverseWrongResultType) {  in TEST_F()  argument
488 TEST_F(ValidateBitwise, OpBitReverseWrongBaseType) {  in TEST_F()  argument
500 TEST_F(ValidateBitwise, OpBitCountSuccess) {  in TEST_F()  argument
510 TEST_F(ValidateBitwise, OpBitCountWrongResultType) {  in TEST_F()  argument
522 TEST_F(ValidateBitwise, OpBitCountBaseNotInt) {  in TEST_F()  argument
534 TEST_F(ValidateBitwise, OpBitCountBaseWrongDimension) {  in TEST_F()  argument