Lines Matching defs:CertificateRequestTest
273 class CertificateRequestTest : public VtsRemotelyProvisionedComponentTests { class
275 CertificateRequestTest() : eekId_(string_to_bytevec("eekid")), challenge_(randomBytes(32)) { in CertificateRequestTest() function in aidl::android::hardware::security::keymint::test::CertificateRequestTest
379 TEST_P(CertificateRequestTest, EmptyRequest_testMode) { in TEST_P() argument
403 TEST_P(CertificateRequestTest, NewKeyPerCallInTestMode) { in TEST_P() argument
441 TEST_P(CertificateRequestTest, DISABLED_EmptyRequest_prodMode) { in TEST_P() argument
456 TEST_P(CertificateRequestTest, NonEmptyRequest_testMode) { in TEST_P() argument
481 TEST_P(CertificateRequestTest, DISABLED_NonEmptyRequest_prodMode) { in TEST_P() argument
497 TEST_P(CertificateRequestTest, NonEmptyRequestCorruptMac_testMode) { in TEST_P() argument
515 TEST_P(CertificateRequestTest, NonEmptyRequestCorruptMac_prodMode) { in TEST_P() argument
534 TEST_P(CertificateRequestTest, NonEmptyCorruptEekRequest_prodMode) { in TEST_P() argument
563 TEST_P(CertificateRequestTest, NonEmptyIncompleteEekRequest_prodMode) { in TEST_P() argument
591 TEST_P(CertificateRequestTest, NonEmptyRequest_prodKeyInTestCert) { in TEST_P() argument
609 TEST_P(CertificateRequestTest, NonEmptyRequest_testKeyInProdCert) { in TEST_P() argument