99 class NfcHidlTest : public ::testing::TestWithParam<std::string> {  class
175 TEST_P(NfcHidlTest, OpenAndClose) {}  in TEST_P()  argument
183 TEST_P(NfcHidlTest, WriteCoreReset) {  in TEST_P()  argument
218 TEST_P(NfcHidlTest, WriteCoreResetConfigReset) {  in TEST_P()  argument
253 TEST_P(NfcHidlTest, WriteInvalidCommand) {  in TEST_P()  argument
274 TEST_P(NfcHidlTest, WriteInvalidAndThenValidCommand) {  in TEST_P()  argument
332 TEST_P(NfcHidlTest, Bandwidth) {  in TEST_P()  argument
413 TEST_P(NfcHidlTest, PowerCycle) {  in TEST_P()  argument
427 TEST_P(NfcHidlTest, PowerCycleAfterClose) {  in TEST_P()  argument
450 TEST_P(NfcHidlTest, CoreInitialized) {  in TEST_P()  argument
477 TEST_P(NfcHidlTest, ControlGranted) {  in TEST_P()  argument
486 TEST_P(NfcHidlTest, ControlGrantedAfterClose) {  in TEST_P()  argument
508 TEST_P(NfcHidlTest, PreDiscover) {  in TEST_P()  argument
517 TEST_P(NfcHidlTest, PreDiscoverAfterClose) {  in TEST_P()  argument
540 TEST_P(NfcHidlTest, CloseAfterClose) {  in TEST_P()  argument
563 TEST_P(NfcHidlTest, OpenAfterOpen) {  in TEST_P()  argument