99 class ChangeLoweringCommonTest  class
109 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeBitToBool) {  in TARGET_TEST_P()  argument
119 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeBoolToBit) {  in TARGET_TEST_P()  argument
128 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeInt32ToTaggedWithSignedSmall) {  in TARGET_TEST_P()  argument
137 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeUint32ToTaggedWithUnsignedSmall) {  in TARGET_TEST_P()  argument
146 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeTaggedToInt32WithTaggedSigned) {  in TARGET_TEST_P()  argument
155 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeTaggedToInt32WithTaggedPointer) {  in TARGET_TEST_P()  argument
165 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeTaggedToUint32WithTaggedSigned) {  in TARGET_TEST_P()  argument
174 TARGET_TEST_P(ChangeLoweringCommonTest, ChangeTaggedToUint32WithTaggedPointer) {  in TARGET_TEST_P()  argument
184 TARGET_TEST_P(ChangeLoweringCommonTest, StoreFieldSmi) {  in TARGET_TEST_P()  argument
203 TARGET_TEST_P(ChangeLoweringCommonTest, StoreFieldTagged) {  in TARGET_TEST_P()  argument
222 TARGET_TEST_P(ChangeLoweringCommonTest, LoadField) {  in TARGET_TEST_P()  argument
240 TARGET_TEST_P(ChangeLoweringCommonTest, StoreElementTagged) {  in TARGET_TEST_P()  argument
267 TARGET_TEST_P(ChangeLoweringCommonTest, StoreElementUint8) {  in TARGET_TEST_P()  argument
291 TARGET_TEST_P(ChangeLoweringCommonTest, LoadElementTagged) {  in TARGET_TEST_P()  argument
315 TARGET_TEST_P(ChangeLoweringCommonTest, LoadElementInt8) {  in TARGET_TEST_P()  argument
336 TARGET_TEST_P(ChangeLoweringCommonTest, Allocate) {  in TARGET_TEST_P()  argument